Sina Baier-Stegmaier

Sina Baier-Stegmaier

Research Engineer

DTU PHYSICS
Department of Physics

Technical University of Denmark

Fysikvej

Building 310, room 038

2800 Kgs. Lyngby

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2020
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Reference standards for XCT measurements of additively manufactured parts

Obaton, Anne-Françoise ; Klingaa, Christopher Gottlieb ; Rivet, Clément ; Mohaghegh, Kamran ; Baier, Sina ; Andreasen, Jan Lasson ; Carli, Lorenzo ; De Chiffre, Leonardo
Presented at:
10th Conference on Industrial Computed Tomography

Type: Paper (Peer reviewed)

Status: Published     |    Year: 2020

2019
  PDF

Build orientation effects on the roughness of SLM channels

Klingaa, C. G. ; Dahmen, T. ; Baier, S. ; Mohanty, S. ; Hattel, J. H.
part of: Proceedings of the Joint Special Interest Group meeting between euspen and ASPE Advancing Precision in Additive Manufacturing (2019), pages: 111-114, 2019
Presented at:
Joint Special Interest Group meeting between euspen and ASPE Advancing Precision in Additive Manufacturing

Type: Conference abstract in proceedings (Peer reviewed)

Status: Published     |    Year: 2019

  PDF

Methodology for geometric characterization and dimensioning of additively manufactured channels

Dahmen, T. ; Klingaa, C. G. ; Baier, S. ; Pedersen, D. B. ; Hattel, J. H.
part of: Proceedings of the Joint Special Interest Group meeting between euspen and ASPE Advancing Precision in Additive Manufacturing (2019), pages: 133-136, 2019
Presented at:
Joint Special Interest Group meeting between euspen and ASPE Advancing Precision in Additive Manufacturing

Type: Conference abstract in proceedings (Peer reviewed)

Status: Published     |    Year: 2019

  PDF

Roughness Investigation of SLM Manufactured Conformal Cooling Channels Using X-ray Computed Tomography

Klingaa, Christopher G. ; Bjerre, Mathias K. ; Baier, Sina ; De Chiffre, Leonardo ; Mohanty, Sankhya ; Hattel, Jesper H.
part of: Proceedings of the 9th Conference on Industrial Computed Tomography, Padova, Italy (iCT 2019), 2019
Presented at:
9th Conference on Industrial Computed Tomography (ICT2019)

Type: Article in proceedings (Peer reviewed)

Status: Published     |    Year: 2019

2018
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In situ Characterization of Catalysts: Combining X-ray and electron microscopy

Damsgaard, Christian Danvad ; Baier, Sina ; Grunwaldt, Jan-Dierk
part of: 69th Annual Meeting of the Nordic Microscopy Society, 2018
Presented at:
69th Annual Conference of the Nordic Microscopy Society

Type: Conference abstract in proceedings (Peer reviewed)

Status: Published     |    Year: 2018

  PDF

Internal Fiber Structure of a High-Performing, Additively Manufactured Injection Molding Insert

Hofstätter, Thomas ; Baier, Sina ; Trinderup, Camilla H. ; Gundlach, Carsten ; Pedersen, David B. ; Tosello, Guido ; Hansen, Hans N
in: A I P Conference Proceedings Series, vol: 2065
Presented at:
34th International Conference of the Polymer Processing Society

Type: Conference article (Peer reviewed)

Status: Published     |    Year: 2018     |    DOI: https://doi.org/10.1063/1.5088312