Hugh Simons

Hugh Simons

Assistant Professor

DTU PHYSICS
Department of Physics

Technical University of Denmark

Fysikvej

Building 307, room 242

2800 Kgs. Lyngby

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2017
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In operando studies of ScYSZ electrolyte supported symmetric solid oxide cell by X-ray Diffraction at ESRF, ID06 Beamline

Sierra, J. X. ; Poulsen, H. F. ; Jørgensen, P. S. ; Detlefs, C. ; Cook, P. ; Simons, H. ; Yildirim, C. ; Ahl, S. R. ; Jakobsen, A. C. ; Kantor, I. ; Bowen, J. R.
Presented at:
3rd International Conference on Tomography of 3D Materials and Structures

Type: Poster

Status: Published     |    Year: 2017

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Simulating and optimizing compound refractive lens-based X-ray microscopes

Simons, Hugh ; Ahl, Sonja Rosenlund ; Poulsen, Henning Friis ; Detlefs, Carsten
in: Journal of Synchrotron Radiation, vol: 24, issue: 2, pages: 392-401

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2017     |    DOI: https://doi.org/10.1107/S160057751602049X

 

Ultra-low-angle boundary networks within recrystallizing grains

Ahl, Sonja Rosenlund ; Simons, Hugh ; Zhang, Yubin ; Detlefs, C. ; Stöhr, Frederik ; Jakobsen, Anders Clemen ; Juul Jensen, Dorte ; Poulsen, Henning Friis
in: Scripta Materialia, vol: 139, pages: 87-91

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2017     |    DOI: https://doi.org/10.1016/j.scriptamat.2017.06.016

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X-ray diffraction microscopy based on refractive optics

Poulsen, Henning Friis ; Jakobsen, A. C. ; Simons, Hugh ; Ahl, Sonja Rosenlund ; Cook, P. K. ; Detlefs, C.
in: Journal of Applied Crystallography, vol: 50, issue: 5, pages: 1441-1456

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2017     |    DOI: https://doi.org/10.1107/S1600576717011037

2016
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Dual strain mechanisms in a lead-free morphotropic phase boundary ferroelectric

Walker, Julian ; Simons, Hugh ; Alikin, Denis O ; Turygin, Anton P ; Shur, Vladimir Y ; Kholkin, Andrei L ; Ursic, Hana ; Bencan, Andreja ; Malic, Barbara ; Nagarajan, Valanoor ; Rojac, Tadej
in: Scientific Reports, vol: 6

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2016     |    DOI: https://doi.org/10.1038/srep19630

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Full-field hard x-ray microscopy with interdigitated silicon lenses

Simons, Hugh ; Stöhr, Frederik ; Michael-Lindhard, Jonas ; Jensen, Flemming ; Hansen, Ole ; Detlefs, Carsten ; Poulsen, Henning Friis
in: Optics Communications, vol: 359, pages: 460-464

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2016     |    DOI: https://doi.org/10.1016/j.optcom.2015.09.103

 

Multiscale 3D characterization with dark-field x-ray microscopy

Simons, Hugh ; Jakobsen, Anders Clemen ; Ahl, Sonja Rosenlund ; Detlefs, Carsten ; Poulsen, Henning Friis
in: MRS Bulletin, vol: 41, issue: 6, pages: 454-459

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2016     |    DOI: https://doi.org/10.1557/mrs.2016.114

 

Quantifying the onset of recrystallization in deformed metals using x-rays

Ahl, Sonja Rosenlund ; Simons, Hugh ; Poulsen, Henning Friis
Presented at:
Sustain-ATV Conference 2016

Type: Conference abstract for conference (Peer reviewed)

Status: Published     |    Year: 2016

 

Reversible Polarization Rotation in Epitaxial Ferroelectric Bilayers

Liu, Guangqing ; Zhang, Qi ; Huang, Hsin-Hui ; Munroe, Paul ; Nagarajan, Valanoor ; Simons, Hugh ; Hong, Zijian ; Chen, Long-Qing
in: Advanced Materials Interfaces

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2016     |    DOI: https://doi.org/10.1002/admi.201600444

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Simultaneous resonant x-ray diffraction measurement of polarization inversion and lattice strain in polycrystalline ferroelectrics

Gorfman, S. ; Simons, Hugh ; Iamsasri, T. ; Prasertpalichat, S. ; Cann, D. P. ; Choe, H. ; Pietsch, U. ; Watier, Y. ; Jones, J. L.
in: Scientific Reports, vol: 6

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2016     |    DOI: https://doi.org/10.1038/srep20829