Hugh Simons

Hugh Simons

Adjunkt

DTU FYSIK
Institut for Fysik

Danmarks Tekniske Universitet

Fysikvej

Bygning 307, rum 242

2800 Kgs. Lyngby

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2020
 

Subgrain dynamics during recovery of partly recrystallized aluminium

Ahl, S. R. ; Simons, H. ; Detlefs, C. ; Juul Jensen, D. ; Poulsen, H. F.
in: Acta Materialia, vol: 185, pages: 142-148

Type: Journal article (Peer reviewed)

Status: Published     |    År: 2020     |    DOI: https://doi.org/10.1016/j.actamat.2019.10.042

2019
 

In-operando observation of microstructural evolution in a solid oxide cell electrolyte operating at high polarization

Sierra, J. X. ; Poulsen, H. F. ; Jørgensen, P. S. ; Detlefs, C. ; Cook, P. ; Simons, H. ; Jakobsen, A. C. ; Bowen, J. R.
in: Journal of Power Sources, vol: 413, pages: 351-359

Type: Journal article (Peer reviewed)

Status: Published     |    År: 2019     |    DOI: https://doi.org/10.1016/j.jpowsour.2018.12.057

  PDF

Mapping of individual dislocations with dark field x-ray microscopy

Jakobsen, A.C. ; Simons, H. ; Ludwig, W. ; Yildirim, C. ; Leemreize, H. ; Porz, L. ; Detlefs, C. ; Poulsen, H.F.
in: Journal of Applied Crystallography, vol: 52, issue: 1, pages: 122-132

Type: Journal article (Peer reviewed)

Status: Published     |    År: 2019     |    DOI: https://doi.org/10.1107/S1600576718017302

  PDF

Multilayer Laue lenses at high X-ray energies: performance and applications

Murray, Kevin T. ; Pedersen, Anders Filsøe ; Mohacsi, Istvan ; Detlefs, Carsten ; Morgan, Andrew J. ; Prasciolu, Mauro ; Yildirim, Can ; Simons, Hugh ; Jakobsen, Anders Clemen ; Chapman, Henry N. ; Poulsen, Henning Friis ; Bajt, Saša
in: Optics Express, vol: 27, issue: 5, pages: 7120-7138

Type: Journal article (Peer reviewed)

Status: Published     |    År: 2019     |    DOI: https://doi.org/10.1364/OE.27.007120

 

Non-destructive mapping of long-range dislocation strain fields in an epitaxial complex metal oxide

Simons, Hugh ; Jakobsen, Anders Clemen ; Ahl, Sonja Rosenlund ; Poulsen, Henning Friis ; Pantleon, Wolfgang ; Chu, Ying-Hao ; Detlefs, Carsten ; Valanoor, Nagarajan
in: Nano letters, vol: 19, issue: 3, pages: 1445-1450

Type: Journal article (Peer reviewed)

Status: Published     |    År: 2019     |    DOI: https://doi.org/10.1021/acs.nanolett.8b03839

 

Sub-surface measurements of the austenite microstructure in response to martensitic phase transformation

Bucsek, Ashley ; Seiner, Hanuš ; Simons, Hugh ; Yildirim, Can ; Cook, Phil ; Chumlyakov, Yuriy ; Detlefs, Carsten ; Stebner, Aaron P.
in: Acta Materialia, vol: 179, pages: 273-286

Type: Journal article (Peer reviewed)

Status: Published     |    År: 2019     |    DOI: https://doi.org/10.1016/j.actamat.2019.08.036

  PDF

The ESRF dark-field x-ray microscope at ID06

Kutsal, M. ; Bernard, P. ; Berruyer, G. ; Cook, P. K. ; Hino, R. ; Jakobsen, A. C. ; Ludwig, W. ; Ormstrup, Jeppe ; Roth, T. ; Simons, Hugh ; Smets, K. ; Sierra, J. X. ; Wade, J. ; Wattecamps, P. ; Yildirim, C. ; Poulsen, Henning Friis ; Detlefs, C.
in: I O P Conference Series: Materials Science and Engineering, vol: 580, issue: 1
Presented at:
40th Risø International Symposium on Material Science: Metal Microstructures in 2D, 3D, and 4D

Type: Conference article (Peer reviewed)

Status: Published     |    År: 2019     |    DOI: https://doi.org/10.1088/1757-899X/580/1/012007

  PDF

X-ray Fourier ptychographic microscopy

Simons, Hugh ; Poulsen, Henning Friis ; Guigay, J. P. ; Detlefs, C.
in: arXiv

Type: Journal article (Peer reviewed)

Status: Submitted     |    År: 2019

2018
 

Dynamics and grain orientation dependence of the electric field induced phase transformation in Sm modified BiFeO3 ceramics

Ormstrup, Jeppe ; Makarovic, Maja ; Majkut, Marta ; Rojac, Tadej ; Walker, Julian ; Simons, Hugh
in: Journal of Materials Chemistry C, vol: 6, issue: 28, pages: 7635-7641

Type: Journal article (Peer reviewed)

Status: Published     |    År: 2018     |    DOI: https://doi.org/10.1039/c8tc01951g

 

Insights into the Exceptional Crystallographic Order of Biominerals Using Dark-Field X-ray Microscopy

Cook, Phil K. ; Simons, Hugh ; Jakobsen, Anders Clemen ; Yildirim, Can ; Poulsen, Henning Friis ; Detlefs, Carsten
in: Microscopy and Microanalysis, vol: 24, issue: S2, pages: 88-89
Presented at:
14th international conference on X-ray Microscopy

Type: Conference abstract in journal (Peer reviewed)

Status: Published     |    År: 2018     |    DOI: https://doi.org/10.1017/S1431927618012837